Advanced Facility for Microscopy and Microanalysis
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Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
FIB
Electron Probe Microanalyzer (EPMA)
Atom Probe Tomography (APT)
XRadia 3D Tomography (Micro CT)
Atomic Force Microscope (AFM)
Triboindentor
Sample Preparation Tools
Computation
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Interact with AFMM
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For Students/Faculties/Employees outside IISc
Slot Booking
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Emergency Contacts
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Industry
Gallery
Opportunities
AFMM Talk Series
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Home
About
Team
Facilities
Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
FIB
Electron Probe Microanalyzer (EPMA)
Atom Probe Tomography (APT)
XRadia 3D Tomography (Micro CT)
Atomic Force Microscope (AFM)
Triboindentor
Sample Preparation Tools
Computation
Use and Service
Interact with AFMM
For IISc students and faculty
For Students/Faculties/Employees outside IISc
Slot Booking
Policies and Safety
Emergency Contacts
Feedback
Instrument Status
News
Industry
Gallery
Opportunities
AFMM Talk Series
