Instruments and capabilities that provide options for characterization of structure and chemistry at various length scales from millimeters down to single atoms in correlative modes enabling researchers to address key problems in the physical sciences and engineering.
To provide cutting-edge capabilities for the characterization of materials at multiple length scales.
We have established complementary capability in the analysis of the structure and chemistry of materials at the atomic scale through transmission electron microscopy and atom probe techniques.
AFMM , Indian Institute of Science , Bengaluru- 560012, Karnataka, India.
Phone (TEM): +91-080-2293 2034 / 2035 Phone (SEM): +91-080-2293 2729 Fax: +91-080-2293 2035 Email: office.afmm@iisc.ac.in
