FIB

ThermoFisher® Helios G4-UX

30 kV FEG source, Everhart Thornley Detector for secondary electron imaging, segmented annular BSE detector with free control over usage of detector quadrants to generate the desired signal, Annular STEM detector, EBSD (EDAX) detector, EDAX EDS detector, MD (Mirror detector), ICE (In-column electron) detector for SE imaging, TLD (Through Lens Detector) for SE imaging

Specifications and Capabilities:

  • Elstar® electron column with UC + technology (monochromation) for high-resolution performance in SE, BSE imaging modes at low voltages
  • Tomahawk® ion column capable of producing ion beam currents ranging from 0.1nA – 61nA
  • Easylift® EX nanomanipulator needle technology that enables lift out of TEM lamellae and atom probe needles from a bulk specimen
  • Gold and Platinum (e-beam / ion beam) gas injection system (GIS) enabled depositions available.
  • Nav-cam® feature which makes navigation to specific regions of the bulk sample fast and simple along with options for saving multiple positions on the bulk sample.

ThermoFisher® Scios-2

30 kV FEG source, Everhart Thornley Detector for secondary electron imaging, segmented annular BSE detector with free control over usage of detector quadrants to generate the desired signal.

Specifications and Capabilities:

  • Elstar® electron column with UC + technology (monochromation) for high-resolution performance in SE, BSE imaging modes at low voltages
  • Tomahawk® ion column capable of producing ion beam currents ranging from 0.1nA – 61nA
  • Easylift® EX nanomanipulator needle technology that enables lift out of TEM lamellae and atom probe needles from a bulk specimen
  • Gold and Platinum (e-beam / ion beam) gas injection system (GIS) enabled depositions available.
  • Nav-cam® feature which makes navigation to specific regions of the bulk sample fast and simple along with options for saving multiple positions on the bulk sample.

Faculty In-charge: Surendra Kumar Makineni