JEOL JZA-8530
30 kV Tungsten source EPMA with high resolution X-ray EDS/WDS analysis
Specifications and Capabilities:
- Tungsten/LaB6 source with variable high tension up to 30kV
- SDD type EDS detector.
- Five Wavelength Dispersive spectrometers with 2-4 crystals per spectrometer and detectable wavelength range from 0.087 to 9.3 nm.
- Quantitative Analysis for the elements ranging from B to U
Faculty In-charge: Sajeev Krishnan, Satyam Suwas