Advanced Facility for Microscopy and Microanalysis
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Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
Talos Arctica 200kV Cryo-TEM
FIB
Electron Probe Microanalyzer (EPMA)
Atom Probe Tomography (APT)
XRadia 3D Tomography (Micro CT)
Atomic Force Microscope (AFM)
Triboindentor
Sample Preparation Tools
Computation
Use and Service
Interact with AFMM
For IISc students and faculty
For Students/Faculties/Employees outside IISc
Slot Booking
Policies and Safety
Emergency Contacts
Feedback
Instrument Status
Publications
2024-25
Industry
Gallery
Workshop
AFMM Talk Series
Advanced Capabilities
News
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Home
About
Team
Facilities
Scanning Electron Microscopes (SEM)
Transmission Electron Microscopes (TEM)
Talos Arctica 200kV Cryo-TEM
FIB
Electron Probe Microanalyzer (EPMA)
Atom Probe Tomography (APT)
XRadia 3D Tomography (Micro CT)
Atomic Force Microscope (AFM)
Triboindentor
Sample Preparation Tools
Computation
Use and Service
Interact with AFMM
For IISc students and faculty
For Students/Faculties/Employees outside IISc
Slot Booking
Policies and Safety
Emergency Contacts
Feedback
Instrument Status
Publications
2024-25
Industry
Gallery
Workshop
AFMM Talk Series
Advanced Capabilities
News
