60 – 300kV low base Titan® Themis^™ with a monochromator, a CEOS probe corrector for Cs aberration corrected STEM and a Quantum 965 Gatan Imaging filter (post column) for EELS analysis

Specifications and Capabilities:

• X-FEG high brightness Schottky FEG capable of higher brightness compared to a traditional S-FEG. Wien filter design monochromator capable of energy resolution ~ 0.3eV at 300kV
• CEOS Probe corrector with DCOR+ software. STEM imaging with sub-angstrom point resolution (0.7Å at 300 kV)
• Single and low-background double Tilt holders. Double tilt holder with both tripod and hexnut style sample holding.
• Fischione^® tomography holder available for tomography experiments in TEM/STEM mode.
• 2k x 2k bright field CCD camera. HREM: Acquisition of focal series in parallel beam geometry followed by exit wave reconstruction using TruImage^® software possible for high resolution studies.
• Four detectors covering large scattering angle range for imaging in STEM mode (BF (plate), DF2 (annular), DF4(annular) and HAADF (annular)) allowing simultaneous imaging of scattered electrons over a large solid angle range.
• Super-X^® EDS technology with four quadrant detectors for ultra-fast EDS data collection through Hypermaps, line-scans and point-scans using Bruker Espirit® software.
• EELS: monochromated/non-monochromated STEM-EELS up to 300kV.  Capability of dual EELS mode that can acquire both spectrum image data cubes in STEM mode and EFTEM images in parallel beam geometry. Gatan quantum 965 imaging filter (GIF).
• EDS-EELS: Simultaneous EDS-EELS data collection via Digital Micrograph.

Faculty In-charge: N Ravishankar, Surendra Kumar Makineni