Gatan® PIPS – II
Precision ion polishing system (PIPS) with the patented Whsiperlok™ system for TEM sample preparation.
Specifications and Capabilities:
- Ability to precisely center the milling target with respect to incident ion beams.
- Improved low energy milling for FIB samples
- Ion energy range from 0.1 – 8 kV
- 10’’ touchscreen control
- Ability to store optical images in Digital Micrograph software.
Faculty In-charge: Surendra Kumar Makineni
Gatan® Solarus Plasma Cleaner
Plasma cleaner for TEM samples to clean surface contaminations with argon, oxygen and hydrogen gas.
Specifications and Capabilities:
- Low power radical generator that produces a glow discharge within the main chamber housing.
- Choice of Argon/Hydrogen/Oxygen gases for surface cleaning.
- Ability to create customized recipes (cleaning time, gas flow rates etc.) for TEM/STEM processes
- Dual TEM holder stand
Faculty In-charge: Surendra Kumar Makineni, Ankur Chauhan
Leica EM UC7 Ultramicrotome
Automatic Ultramicrotome instrument used to prepare semi and ultrathin sections as well as perfect smooth surfaces of biological and industrial samples for TEM, SEM, AFM and LM experiments.
Specifications and Capabilities:
- Eucentric movement of the stereomicroscope observation system with designated positions for specimen approach, for glass and diamond knives.
- In addition to the standard LED illumination for top light, backlight and transmitted light, the LED spot illumination offers a focused light beam to enhance observation.
Faculty In-charge: Ankur Chauhan, Surendra Kumar Makineni