Microscope capable for AFM, KPFM and CAFM related experiments.

Specifications and Capabilities:

• Operates in contact mode, intermittent contact mode, and tapping mode
• Can be used to obtain AFM images for topography information, Kelvin-Probe FM for surface potential mapping and Conducting AFM for surface resistivity measurements.
• Maximum sample size: 1cm X 1cm X 1cm

Faculty In-charge: Sachin R Rondiya