SEM
ThermoFisher® Sirion®
30 kV FEG source SEM for high resolution SE/BSE imaging with EDS and EBSD detectors
Specifications and Capabilities:
- Schottky-FEG source with variable high tension up to 30kV
- Everhart Thornley (ET) detector for SE imaging and solid-state detector for BSE imaging.
- EDAX® EDS detector for X-ray analysis. Coupled with TEAM software
- EBSD analysis for texture determination
ThermoFisher® XL-30 ESEM
30 kV Tungsten source environmental SEM for SE/BSE imaging with EDS spectroscopy.
Specifications and Capabilities:
- Tungsten source with variable high tension up to 30kV
- Everhart Thornley (ET) detector for SE imaging and solid-state detector for BSE imaging.
- EDAX® EDS detector for X-ray analysis. Coupled with GENESISTM software
- Environmental imaging ability under 1 Torr to 20 Torr pressure
JEOL SEM IT 300
30 kV Tungsten source SEM for SE/BSE imaging with EDS spectroscopy and Cathodoluminescence (SEM-CL) experiments.
Specifications and Capabilities:
- Tungsten source with variable high tension up to 30kV
- Load lock chamber for quick sample exchange and stage navigation system.
- SE/BSE imaging with resolution up to 3 nm (30kV) and 15 nm (1kV) in HV mode and 4 nm (30kV BED) LV mode
- Cathodoluminescence (SEM-CL) detector for CL experiments.
- EDAX® EDS detector for X-ray analysis.
ThermoFisher® Helios G4-UX
30 kV FEG source, Everhart Thornley Detector for secondary electron imaging, segmented annular BSE detector with free control over usage of detector quadrants to generate the desired signal, Annular STEM detector, EBSD (EDAX) detector, EDAX EDS detector, MD (Mirror detector), ICE (In-column electron) detector for SE imaging, TLD (Through Lens Detector) for SE imaging
Specifications and Capabilities:
- Elstar® electron column with UC + technology (monochromation) for high-resolution performance in SE, BSE imaging modes at low voltages
- Tomahawk® ion column capable of producing ion beam currents ranging from 0.1nA – 61nA
- Easylift® EX nanomanipulator needle technology that enables lift out of TEM lamellae and atom probe needles from a bulk specimen
- Gold and Platinum (e-beam / ion beam) gas injection system (GIS) enabled depositions available.
- Nav-cam® feature which makes navigation to specific regions of the bulk sample fast and simple along with options for saving multiple positions on the bulk sample.